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Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. 超快科学, 2021(2). doi: 10.34133/2021/9848526
引用本文: Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. 超快科学, 2021(2). doi: 10.34133/2021/9848526
Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. Ultrafast Science, 2021(2). doi: 10.34133/2021/9848526
Citation: Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. 2021: THz-Enhanced DC Ultrafast Electron Diffractometer. Ultrafast Science, 2021(2). doi: 10.34133/2021/9848526

THz-Enhanced DC Ultrafast Electron Diffractometer

doi: 10.34133/2021/9848526
基金项目: 

The authors gratefully acknowledge the expert support from Thomas Tilp and Andrej Berg for the fabrication of the THz device used in this work. This work has been supported by the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) through the Synergy Grant AXSIS (609920), Project KA908-12/1 of the Deutsche Forschungsgemeinschaft, the Cluster of Excellence “CUI: Advanced Imaging of Matter” of the Deutsche Forschungsgemeinschaft (DFG)—EXC 2056—project ID 390715994, and the Accelerator on a Chip Program (ACHIP) funded by the Gordon and Betty Moore Foundation (GBMF4744).

详细信息
    通讯作者:

    Correspondence should be addressed to Franz X. Kärtner

THz-Enhanced DC Ultrafast Electron Diffractometer

Funds: 

The authors gratefully acknowledge the expert support from Thomas Tilp and Andrej Berg for the fabrication of the THz device used in this work. This work has been supported by the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) through the Synergy Grant AXSIS (609920), Project KA908-12/1 of the Deutsche Forschungsgemeinschaft, the Cluster of Excellence “CUI: Advanced Imaging of Matter” of the Deutsche Forschungsgemeinschaft (DFG)—EXC 2056—project ID 390715994, and the Accelerator on a Chip Program (ACHIP) funded by the Gordon and Betty Moore Foundation (GBMF4744).

  • 摘要:

    Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.

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出版历程
  • 收稿日期:  2021-04-11
  • 修回日期:  2021-06-25
  • 刊出日期:  2021-08-25

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