THz-Enhanced DC Ultrafast Electron Diffractometer

Dongfang Zhang; Tobias Kroh; Felix Ritzkowsky; Timm Rohwer; Moein Fakhari; Huseyin Cankaya; Anne-Laure Calendron; Nicholas H. Matlis; Franz X. Kärtner

doi:10.34133/2021/9848526

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THz-Enhanced DC Ultrafast Electron Diffractometer

Research Article | Updated：2024-10-21

- THz-Enhanced DC Ultrafast Electron Diffractometer
- Ultrafast Science Vol. 2021, Issue 2, (2021)
- Affiliations：
  
  1. Center for Free-Electron Laser Science, Deutsches Elektronen Synchrotron, Notkestrasse 85,Hamburg,Germany,22607
  2. Collaborative Innovation Center for IFSA, School of Physics and Astronomy, Shanghai Jiao Tong University,Shanghai,China,200240
  3. Department of Physics and The Hamburg Centre for Ultrafast Imaging, Universität Hamburg, Luruper Chaussee 149,Hamburg,Germany,22761
- Author bio：
- Funds：
- DOI：10.34133/2021/9848526
  CLC：
- Published：2021，
- Accepted：
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DONGFANG ZHANG, TOBIAS KROH, FELIX RITZKOWSKY, et al. THz-Enhanced DC Ultrafast Electron Diffractometer. [J]. Ultrafast science, 2021, 2021(2).
DOI：

DONGFANG ZHANG, TOBIAS KROH, FELIX RITZKOWSKY, et al. THz-Enhanced DC Ultrafast Electron Diffractometer. [J]. Ultrafast science, 2021, 2021(2). DOI： 10.34133/2021/9848526.

摘要

Abstract

Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here

we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10

000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.

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