

FOLLOWUS
a Dipartimento di Fisica, Politecnico di Milano, Piazza L. da Vinci 32, 20133 Milano, Italy. b Department of Chemistry and INSTM, University of Pavia, Via T. Taramelli 14, 27100 Pavia, Italy. c ICFO - Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, Castelldefels08860, Barcelona, Spain. d ICREA - Institució Catalana de Recerca i Estudis Avançats, Passeig Lluís Companys 23, 08010 Barcelona, Spain. e IFN-CNR, Piazza L. da Vinci 32, 20133 Milano,Italy
Published:2023,
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Martin Hörmann, Federico Visentin, Andrea Zanetta, Johann Osmond, Giulia Grancini, Niek F. van Hulst, Matz Liebel, Giulio Cerullo, Franco V. A. Camargo. 2023: High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy. 超快科学, 3(5).
Martin Hörmann, Federico Visentin, Andrea Zanetta, Johann Osmond, Giulia Grancini, Niek F. van Hulst, Matz Liebel, Giulio Cerullo, Franco V. A. Camargo. 2023: High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy. Ultrafast Science, 3(5).
Martin Hörmann, Federico Visentin, Andrea Zanetta, Johann Osmond, Giulia Grancini, Niek F. van Hulst, Matz Liebel, Giulio Cerullo, Franco V. A. Camargo. 2023: High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy. 超快科学, 3(5). DOI: 10.34133/ultrafastscience.0032
Martin Hörmann, Federico Visentin, Andrea Zanetta, Johann Osmond, Giulia Grancini, Niek F. van Hulst, Matz Liebel, Giulio Cerullo, Franco V. A. Camargo. 2023: High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy. Ultrafast Science, 3(5). DOI: 10.34133/ultrafastscience.0032
Ultrafast transient microscopy is a key tool to study the photophysical properties of materials in space and time
but current implementations are limited to ≈1-μm fields of view
offering no statistical information for heterogeneous samples. Recently
we demonstrated wide-field transient imaging based on multiplexed off-axis holography. Here
we perform ultrafast microscopy in parallel around a hundred diffraction-limited excitation spots over a ≈60-μm field of view
which not only automatically samples the photophysical heterogeneity of the sample over a large area but can also be used to obtain a 10-fold increase in signal-to?noise ratio by computing an average spot. We apply our microscope to study the carrier diffusion processes in methylammonium lead bromide perovskites. We observe strong diffusion due to the presence of hot carriers during the first picosecond and slower diffusion afterward. We also describe how many-body kinetics can be misleadingly interpreted as strong diffusion at high excitation densities
while at weak excitation
real diffusion is observed. Therefore
the vast increase in sensitivity offered by this technique benefits the study of carrier transport not only by reducing data acquisition times but also by enabling the measurement of the much smaller signals generated at low carrier densities.
Ultrafast transient microscopy is a key tool to study the photophysical properties of materials in space and time
but current implementations are limited to ≈1-μm fields of view
offering no statistical information for heterogeneous samples. Recently
we demonstrated wide-field transient imaging based on multiplexed off-axis holography. Here
we perform ultrafast microscopy in parallel around a hundred diffraction-limited excitation spots over a ≈60-μm field of view
which not only automatically samples the photophysical heterogeneity of the sample over a large area but can also be used to obtain a 10-fold increase in signal-to?noise ratio by computing an average spot. We apply our microscope to study the carrier diffusion processes in methylammonium lead bromide perovskites. We observe strong diffusion due to the presence of hot carriers during the first picosecond and slower diffusion afterward. We also describe how many-body kinetics can be misleadingly interpreted as strong diffusion at high excitation densities
while at weak excitation
real diffusion is observed. Therefore
the vast increase in sensitivity offered by this technique benefits the study of carrier transport not only by reducing data acquisition times but also by enabling the measurement of the much smaller signals generated at low carrier densities.
Xu, J., Feng, T., Wang, A. et al. Fourier ptychographic microscopy with adaptive resolution strategy. Optics Letters, 2024, 49(13): 3548-3551. DOI:10.1364/OL.525289.
Xu, J., Feng, T., Wang, A. et al. Fourier ptychographic microscopy with adaptive resolution strategy. Optics Letters, 2024, 49(13): 3548-3551. DOI:10.1364/OL.525289.
Hörmann, M., Visentin, F., Chakraborty, S.K. et al. Self-referencing for quasi shot-noise-limited widefield transient microscopy. Optics Express, 2024, 32(12): 21230-21242. DOI:10.1364/OE.525581.
Hörmann, M., Visentin, F., Chakraborty, S.K. et al. Self-referencing for quasi shot-noise-limited widefield transient microscopy. Optics Express, 2024, 32(12): 21230-21242. DOI:10.1364/OE.525581.
Vazquez, G.D.B., Morganti, G.L.G., Block, A. et al. Spatiotemporal Microscopy: Shining Light on Transport Phenomena. Advanced Electronic Materials, 2024, 10(2): 2300584. DOI:10.1002/aelm.202300584.
Vazquez, G.D.B., Morganti, G.L.G., Block, A. et al. Spatiotemporal Microscopy: Shining Light on Transport Phenomena. Advanced Electronic Materials, 2024, 10(2): 2300584. DOI:10.1002/aelm.202300584.
Liang, J., Légaré, F., Calegari, F. Ultrafast Imaging. Ultrafast Science, 2024. DOI:10.34133/ultrafastscience.0059.
Liang, J., Légaré, F., Calegari, F. Ultrafast Imaging. Ultrafast Science, 2024. DOI:10.34133/ultrafastscience.0059.
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