Recent advancements in high-energy terahertz (THz) sources

driven by powerful laser systems

now enable the generation of ultrashort THz pulses with energies up to several millijoules

spanning frequencies from 1 to 30 THz. A key breakthrough is developing a reliable single-shot detection method

essential for measuring the electric field of these broadband

low-repetition-rate pulses

which is vital for exploring the complex dynamics of THz emission and studying extreme nonlinear material responses in this range. Existing detection methods have been limited to lower frequencies. Here

we introduce the first potentially single-shot-capable THz detection technique for capturing ultra-broadband waveforms. Utilizing a 1-μm-thick SiN detection chip

we exploit THz field-induced second harmonic generation to achieve real-time monitoring of THz waveforms with frequency content up to 30 THz. By adjusting the angle between the THz and optical probe beams

we can fine-tune the detection window for enhanced flexibility. Our novel THz detector is ideally suited for high-energy

low-repetition-rate sources

unlocking new frontiers in THz research.